Description of equipment

The whole system consists of:

• SEM (JEOL JSM 6490LV): vacuum sample chamber, electron source tower (W cathode), electromagnetic lenses and deflection coils and signal detectors (SE, BSE),
• EDS (INCA PentaFETx3 detector and INCA Energy 350 microanalysis system),
• Baltec SCD 050 sample preparation system.

The Baltec SCD 050 gold sputter and carbon sputter system is designed for sample preparation prior to analysis.

Technical data:

• resolution: high vacuum: 3,0 nm (30 kV), 8,0 nm (3 kV), 15 nm (1 kV); low vacuum: 4,0 nm (30 kV),
• magnification: ×5 - ×300.000,
• Accelerating voltage: 0,3 kV - 30 kV,
• displacement of the sample table: X: 125 mm, Y: 100 mm, Z: 5 mm - 80 mm, tilt: -10° - +90°, rotation: 360°,
• pressure in low vacuum mode: 1 - 270 Pa,
• EDS detector: Si(Li), 30 mm2 detector area, resolution 133 eV at MnKa, ultra-thin polymer window (ATW2) detector.

Access to equipment of equipment

SEM/EDS is used in various fields of geology, but also for other applications:

• palaeontological investigations,
• sediment-petrological investigations,
• Coal investigations,
• mineralogical testing of materials,
• geochemical studies of environmental media,
• other applications: analysis of synthetic fibres, archaeological artefacts.

Equipment rental

Recording and measurements on the SEM/EDS are also carried out by qualified GeoZS operators, by prior agreement with the Administrator, for external clients and in cooperation with the service users.