Description of equipment

The ultra-high resolution fiber electron microscope (FE-SEM) allows the observation of the surface of materials at the sub-nanometre level.

The SDD Energy Dispersive Spectrometer (EDS) with improved energy resolution allows the quantification of light elements and the determination of the composition of materials at the submicron level, as well as the separation between elements whose characteristic beam energies are very close to each other.

Backscattered electron diffraction (EBSD) detects the diffraction of backscattered electrons (BSE) on the crystal planes of a sample and produces a diffraction pattern characteristic of the crystal structure and orientation of the sample, which provides information on mineral phases, crystal grain orientation, defects in the crystal grains, grain boundaries, and the homogeneity of the sample at the submicron level.

Cathodoluminescence (CL) detects EM waves in the visible spectrum and forms an image of all the elements or features in a material that cause the emission of EM waves. This gives an insight into the distribution of trace elements in minerals and phases, which depends on different processes, mineral and phase growth, zonarity, cementation, etc.

Technical data:

• FE-SEM (ThermoFisher Apreo 2S with Schottky field emission thermal electron source):
  • Accelerating voltage: 0,2 - 30 kV;
  • electron beam current: 1 pA - 50 nA;
  • resolution: at 15 kV = 0,5 nm (BD); at 1 kV = 0,8 (BD); at 15 kV (30 Pa) = 1,2 nm;
  • magnification: 10× - 1,000,000×;
  • table (X = Y = 110 mm, Z = 65 mm, T = -15 to +90°, R = 360°);
  • Variable pressure (10 - 500 Pa);
  • 2 in-lens detectors (SE, BSE);
  • 1 in-column detector (SE);
  • E-T SE detector;
  • SE detector for LV mode observation;
  • segmented BSE detector.

• Dry SDD EDS (Oxford UltimMax 65, AZtecLive Automated):
  • active area 65 mm2;
  • resolution better than 125 eV at Mn Ka and 50,000 cps.
• EBSD (Oxford AZtec HKL Symmetry S2 Advanced):
  • captured image resolution 1244 x 1024 pixels;
  • hitrost indeksiranja >4000 pps;
  • 5 integrated forward scattered electron detectors (FSD detector) for orientation and phase Z-contrast.
• CL detector (ThermoFisher):
  • RGB, wavelength: 350 nm - 900 nm. 

Access to equipment of equipment

FE-SEM/EDS/EBSD/CL is used for in-depth and specialised research involving detailed analyses of the surface micromorphology, chemical composition and microstructures of various geological and geochemical information carriers at the submicron level, as well as the identification of polymorphic minerals and phases in different geological and environmental media. The information obtained from this system contributes to the understanding of natural and anthropogenic processes in the environment.

Use in the Mineral Resources, Groundwater and Geochemistry, Regional Geology and various research projects. 

Equipment rental

We also carry out analyses for external clients. The price is set by the GeoZS internal price list or by agreement.